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(parent: fa33d2b) | patch
Add gtest for split with negative axis. (#3915)
authorDevansh Bansal/SNAP /SRI-Bangalore/Engineer/삼성전자 <b.devansh@samsung.com>
Mon, 10 Dec 2018 01:21:57 +0000 (06:51 +0530)
committer오형석/동작제어Lab(SR)/Staff Engineer/삼성전자 <hseok82.oh@samsung.com>
Mon, 10 Dec 2018 01:21:57 +0000 (10:21 +0900)
commitc0b29798fccb298096be2e7ad61a6b49c84b54c8
tree76209c422ed3cfdafe97fc68a777d896165009ebtree | snapshot
parentfa33d2b144c2c206158a57087a8c930cf93637eccommit | diff
Add gtest for split with negative axis. (#3915)

This patch adds a test case for split with negative axis.

Signed-off-by: b.devansh <b.devansh@samsung.com>
runtimes/tests/neural_networks_test/specs/Ex/split_ex_4D_int32_5.mod.py [new file with mode: 0644] blob
Domain: Machine Learning / ML Framework;