Fix defects detected by static analysis tool 82/174582/1
authorJi-hoon Lee <dalton.lee@samsung.com>
Tue, 3 Apr 2018 06:04:00 +0000 (15:04 +0900)
committerJi-hoon Lee <dalton.lee@samsung.com>
Tue, 3 Apr 2018 06:04:05 +0000 (15:04 +0900)
commitbcb968e6b92f1aedf88eb9eb38013d7565012299
tree8f147aa5ce835cabfd8e235aa3eac1728270c3da
parentc72e1a860964ea8d52cb6d8fd39179b92c9bb58d
Fix defects detected by static analysis tool

Change-Id: I291830b6ad35b1759cbe110bba605d90c584c185
ism/extras/efl_panel/isf_panel_efl.cpp
ism/modules/panelagent/ecoresocket/ecore_socket_panel_agent_module.cpp
ism/src/isf_info_manager.cpp
ism/src/isf_info_manager.h
ism/src/scim_helper_launcher.cpp
ism/src/scim_utility.h