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(parent: 45efbbc) | patch
[exo-tflite] Rewriting a test using exo::test::TestGraph (#7924)
author윤현식/On-Device Lab(SR)/Principal Engineer/삼성전자 <hyunsik.yoon@samsung.com>
Mon, 7 Oct 2019 05:45:23 +0000 (14:45 +0900)
committer박종현/On-Device Lab(SR)/Staff Engineer/삼성전자 <jh1302.park@samsung.com>
Mon, 7 Oct 2019 05:45:23 +0000 (14:45 +0900)
commitbc5bcbfc60e541baed4535d92fc9f50005eaa5da
tree735be7aa976e94f937ace68419779325a08a875ftree | snapshot
parent45efbbc288b31bd928854cef857fe81b37145d63commit | diff
[exo-tflite] Rewriting a test using exo::test::TestGraph (#7924)

Test was re-written using exo::test::TestGraph and was simplified.

Signed-off-by: Hyun Sik Yoon <hyunsik.yoon@samsung.com>
compiler/exo-tflite/src/Dialect/Service/TFLShapeInferenceRule.test.cpp diff | blob | history
Domain: Machine Learning / ML Framework;