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YACA: invalid param tests for latest key functionalities 90/81190/4
authorLukasz Pawelczyk <l.pawelczyk@samsung.com>
Fri, 22 Jul 2016 13:39:14 +0000 (15:39 +0200)
committerLukasz Pawelczyk <l.pawelczyk@samsung.com>
Wed, 3 Aug 2016 09:31:59 +0000 (11:31 +0200)
commitbafaa12c357e98bbccb87f301787e10a37cf9360
tree21522ccfa09362ce5e9c06ec8d1260b52bc4eae3tree | snapshot
parent09b69c8506010fb36c20217aaa37bf358316808acommit | diff
YACA: invalid param tests for latest key functionalities

- EC keys
- DH keys
- generation of parameters
- generation of keys from parameters
- extraction of parameters
- extraction of public (this already existed, but had no tests)

Change-Id: Ifb26eeea43923426750ed269bfe92183b5854a7d
src/yaca/yaca-test-common.cpp diff | blob | history
src/yaca/yaca-test-common.h diff | blob | history
src/yaca/yaca-test-key.cpp diff | blob | history
Domain: Security / Uncategorized;