YACA: key generation tests for EC, DH and also related to parameters 28/81328/3
authorLukasz Pawelczyk <l.pawelczyk@samsung.com>
Mon, 25 Jul 2016 12:40:54 +0000 (14:40 +0200)
committerLukasz Pawelczyk <l.pawelczyk@samsung.com>
Thu, 4 Aug 2016 07:39:05 +0000 (09:39 +0200)
commitb77bef6a0c208593f5b45168b8bd88db19c2e619
tree9d7d8dac0cbe67492ca87f27915ab432e22ad05e
parentbafaa12c357e98bbccb87f301787e10a37cf9360
YACA: key generation tests for EC, DH and also related to parameters

Change-Id: If09542527ce793c87380cc74e8f2d9c6d89a6404
src/yaca/yaca-test-common.cpp
src/yaca/yaca-test-common.h
src/yaca/yaca-test-key.cpp