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(parent: 3edd208) | patch
test_common divided into positive and negative tests 34/228534/1 submit/tizen/20200324.041440
authorAgnieszka Baumann <a.baumann@samsung.com>
Wed, 4 Mar 2020 16:13:37 +0000 (17:13 +0100)
committerAgnieszka Baumann <a.baumann@samsung.com>
Mon, 23 Mar 2020 13:32:07 +0000 (14:32 +0100)
commitb40a0e2c59f1ec03a01950df845f2ccea634104d
tree348461d05cb2cf8f6067b80e780c05d31775e704tree | snapshot
parent3edd2089689648d61a52268134173c12cebe8c9ccommit | diff
test_common divided into positive and negative tests

Change-Id: I35fb99d45fdec21892019dc6268b7e1ed2a79c54
Makefile.am diff | blob | history
src/tests/test_common.c diff | blob | history
src/tests/test_common_neg.c [new file with mode: 0644] blob
src/tests/test_common_pos.c [new file with mode: 0644] blob
src/tests/test_common_wrap.c [new file with mode: 0644] blob
Domain: System / System Framework;