Fixed rounding issue in spirv_assembly tests
authorDae Kim <dae.kim@imgtec.com>
Tue, 27 Mar 2018 09:54:23 +0000 (10:54 +0100)
committerDae Kim <dae.kim@imgtec.com>
Tue, 27 Mar 2018 09:54:23 +0000 (10:54 +0100)
commita9f8b60c42134674482140dd5cd4125a67b8d4db
tree89e09a5cb0703bd636c0c25f8383c601c41e2746
parent8945d92c79abf5df647f2c1fa3f5b2f522940807
Fixed rounding issue in spirv_assembly tests

The test assumes that the host system and the device use the same
rounding mode. When this is not the case, the derived rounding errors
make the test fail unexpectedly. By rounding the input values down we
avoid differences in the test output caused by the rounding modes in
use.

Affects:

dEQP-VK.spirv_assembly.instruction.compute.loop_control.dependency_infinite

Components: Vulkan

VK-GL-CTS issue: 1097

Change-Id: I3678e38cbe5c6d57cecef91e7398df0d04763851
external/vulkancts/modules/vulkan/spirv_assembly/vktSpvAsmLoopDepInfTests.cpp