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(parent: f60468f) | patch
Improve I2C test by using new APIs 78/132078/3
authorHyeongsik Min <hyeongsik.min@samsung.com>
Thu, 1 Jun 2017 04:05:45 +0000 (13:05 +0900)
committerHyeongsik Min <hyeongsik.min@samsung.com>
Thu, 1 Jun 2017 06:43:11 +0000 (06:43 +0000)
commita800f2e3a145901ee2791462cef3b735601438b2
treecdcd2c4010d95fda273415bceca95dfc5d630a41tree | snapshot
parentf60468fcf4509ed4452dd2cd930e501e14ee5f77commit | diff
Improve I2C test by using new APIs

Change-Id: I06302e2c4c633a1746d58384554c7ba0e59e90b0
Signed-off-by: Hyeongsik Min <hyeongsik.min@samsung.com>
test/peripheral-io-test.c diff | blob | history
Domain: System / System Framework Device Management;