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(parent: 5015b37) | patch
Add tests for new drain and flush functions in UART api 00/287200/3
authorAntoni Adaszkiewicz <a.adaszkiewi@samsung.com>
Tue, 24 Jan 2023 16:29:47 +0000 (17:29 +0100)
committerAntoni Adaszkiewicz <a.adaszkiewi@samsung.com>
Mon, 13 Feb 2023 13:33:11 +0000 (14:33 +0100)
commita414f5de92027992bdcc28058f89c75d1d93f60b
tree36bca46d2a2e44b32b49f50edb1290010a1ef772tree | snapshot
parent5015b370561c8e4c94a1ccec8dba46a73ed31942commit | diff
Add tests for new drain and flush functions in UART api

Change-Id: I7ec9d9b0893f1628c96e23c41b7119f3e01bd51b
test/include/test_peripheral_uart.h diff | blob | history
test/peripheral-io-test.c diff | blob | history
test/src/test_peripheral_uart.c diff | blob | history
Domain: System / System Framework Device Management;