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(parent: e32301e) | patch
Remove TopK tests from generated test skip file (#2401)
author윤현식/동작제어Lab(SR)/Principal Engineer/삼성전자 <hyunsik.yoon@samsung.com>
Wed, 22 Aug 2018 07:19:42 +0000 (16:19 +0900)
committer오형석/동작제어Lab(SR)/Staff Engineer/삼성전자 <hseok82.oh@samsung.com>
Wed, 22 Aug 2018 07:19:42 +0000 (16:19 +0900)
commita16b7ba5fc20f8f7c65a7c1131adcf06f3db0ad8
treee10701898e54356b3934a991878a56e76f3f200etree | snapshot
parente32301e63db0ba7c8362e535da36a7c35eb8ceb5commit | diff
Remove TopK tests from generated test skip file (#2401)

ACL to support TopK was enhanced so TopK tests in skip file was removed.

Signed-off-by: Hyun Sik Yoon <hyunsik.yoon@samsung.com>
runtimes/tests/neural_networks_test/runtime_run_android_nn_test.skip.armv7l-linux diff | blob | history
runtimes/tests/neural_networks_test/runtime_run_android_nn_test.skip.armv7l-tizen diff | blob | history
Domain: Machine Learning / ML Framework;