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(parent: 908e1f1) | patch
tests: make test time output configurable with TIME_DIFF_THRESHOLD
authorMike Blumenkrantz <zmike@osg.samsung.com>
Mon, 26 Mar 2018 18:41:09 +0000 (14:41 -0400)
committerWonki Kim <wonki_.kim@samsung.com>
Tue, 10 Apr 2018 13:25:45 +0000 (22:25 +0900)
commita0da2ef384fcd5dfe7f51d8ec10e6b6af8183970
treebc008b093b65001e28160629032c81380d71e227tree | snapshot
parent908e1f121569d5fa11deb89c621661857abb65f0commit | diff
tests: make test time output configurable with TIME_DIFF_THRESHOLD

setting this value too low will likely lead to unmanageable results

Reviewed-by: Stefan Schmidt <stefan@osg.samsung.com>
src/tests/efl_check.h diff | blob | history
Domain: UI Framework / EFL;