Fix defect detected by static anlaysis tool 46/174346/1
authorJi-hoon Lee <dalton.lee@samsung.com>
Fri, 30 Mar 2018 07:34:01 +0000 (16:34 +0900)
committerJi-hoon Lee <dalton.lee@samsung.com>
Fri, 30 Mar 2018 07:34:01 +0000 (16:34 +0900)
commit9a158bc212897bd3b636426b71b23d1e87d06517
treed6ab1b961ebc87d6cb09de89a34badae4330f5ad
parente58de78992409e05d7f7496e8d8f10b65b4e2f9c
Fix defect detected by static anlaysis tool

Change-Id: I8dad8766004bf3276e47f8c093eb2a7d4a8ef6ce
ism/extras/wayland_immodule/wayland_imcontext.c