YACA: invalid param tests for yaca_key_derive_dh/_kdf 52/82752/5
authorDariusz Michaluk <d.michaluk@samsung.com>
Fri, 5 Aug 2016 12:35:01 +0000 (14:35 +0200)
committerKrzysztof Jackiewicz <k.jackiewicz@samsung.com>
Wed, 10 Aug 2016 15:01:37 +0000 (08:01 -0700)
commit8f833deab989fb1aa9ca2a823cd969487e300ad8
tree48e36dc023d8caa0c084498fa8845d9d612ce439
parent2b092db01a87d72651cc6b67a1e747b565004fd0
YACA: invalid param tests for yaca_key_derive_dh/_kdf

Change-Id: I89787aad7caf11403ee2bf6594dd162567bd33d8
src/yaca/yaca-test-key.cpp