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(parent: 0dd4f9f) | patch
[X86] Fast-isel tests for lowered truncation intrinsics
authorMikhail Dvoretckii <mikhail.dvoretckii@intel.com>
Tue, 10 Jul 2018 08:26:54 +0000 (08:26 +0000)
committerMikhail Dvoretckii <mikhail.dvoretckii@intel.com>
Tue, 10 Jul 2018 08:26:54 +0000 (08:26 +0000)
commit89c919c20b5942c839091b9628d672a8efc541c7
treece7c3450be52b8f60e68123a85b0fc46f345869dtree | snapshot
parent0dd4f9f22fdba48cd30d4546f67c9ac8de3f1372commit | diff
[X86] Fast-isel tests for lowered truncation intrinsics

This patch adds fast-isel tests for the IR patterns produced for truncation
intrinsics in rC336643.

Differential Revision: https://reviews.llvm.org/D48822

llvm-svn: 336645
llvm/test/CodeGen/X86/avx512bwvl-intrinsics-fast-isel.ll diff | blob | history
llvm/test/CodeGen/X86/avx512vl-intrinsics-fast-isel.ll diff | blob | history
Domain: System / Toolchain;