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(parent: b20ae44) | patch
[NFC] test case clean up
authorLei Huang <lei@ca.ibm.com>
Wed, 18 Apr 2018 20:22:26 +0000 (20:22 +0000)
committerLei Huang <lei@ca.ibm.com>
Wed, 18 Apr 2018 20:22:26 +0000 (20:22 +0000)
commit829cd8e263dc218580abe63e8c2d592025ef5e65
tree66c5aa1317aa5478754f366b5978d469ec4c87c9tree | snapshot
parentb20ae44ed096523541cca039a8f903fd12190f0ecommit | diff
[NFC] test case clean up

1. remove redundant tests
2. update XForm_tests to generated expected code gen

llvm-svn: 330290
llvm/test/CodeGen/PowerPC/f128-conv.ll diff | blob | history
Domain: System / Toolchain;