make unittests less verbose
authorArnaud Renevier <a.renevier@samsung.com>
Fri, 2 Oct 2015 19:02:32 +0000 (12:02 -0700)
committerYoungsoo Choi <kenshin.choi@samsung.com>
Tue, 10 Jul 2018 07:55:23 +0000 (07:55 +0000)
commit7eb37381617c8a301d475ec20c05d6a8250ec0e9
tree3cd1eb69f3d97d034d210a39919f37be2ceb4ad9
parentf19e5d512b865a327789ced7f3bdad8009e55acc
make unittests less verbose

Right now, the unittests are verbose and produce a lot of outputs. This
makes it difficult to debug them.

This patch sets different levels of logging: debug, info, warning and
error. By default, debug messages aren't showed anymore. That way, it
will be easier to see when something actually goes wrong in a test.

It's possible to display them again by setting the environment variable
UTC_MIN_LOG to DEBUG

Reviewed by: a1.gomes, hh4813.kim, sns.park

Change-Id: I6f4e8d61ff5ec24eaccec5240d3fa106edd8ff7c
Signed-off-by: Arnaud Renevier <a.renevier@samsung.com>
tizen_src/ewk/unittest/utc_blink_ewk_base.cpp
tizen_src/ewk/unittest/utc_blink_ewk_base.h