e_test_event: add method for transient_for_below 14/232114/2
authorJunseok, Kim <juns.kim@samsung.com>
Tue, 28 Apr 2020 09:13:09 +0000 (18:13 +0900)
committerDoyoun Kang <doyoun.kang@samsung.com>
Wed, 29 Apr 2020 00:32:57 +0000 (00:32 +0000)
commit7e3d03091b82425e9399cf09bcc0655a3b05a730
tree1d0f6787b2268864f05f2f5dc4ea63c011fda381
parent7ddef0084fe1597edffcb8ffeac0be454de388c9
e_test_event: add method for transient_for_below

Change-Id: Ie7cc00546b3d2188f4afcbeeeda8d738b46826d3
src/e_test_event.cpp
src/e_test_event.h