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Backout NFC HAL test package. 47/185747/1 accepted/tizen/unified/20180802.135000 submit/tizen/20180802.043858
authorsaerome.kim <saerome.kim@samsung.com>
Thu, 2 Aug 2018 04:02:48 +0000 (13:02 +0900)
committersaerome.kim <saerome.kim@samsung.com>
Thu, 2 Aug 2018 04:02:48 +0000 (13:02 +0900)
commit7a304359fecf77e921e2f534a6fc999034b05d4e
treea735d9053999f32d3b47843aab47e77266bc5b58tree | snapshot
parenta6c9959c2a7cbb17bed65efaf5b8b29d812efe6dcommit | diff
Backout NFC HAL test package.

Current NFC HAL test uses NFC CAPI. This behavior causes dependecy
inversion. Therefore we backout previous change and move HAL test
package to NFC CAPI layer.

Change-Id: I53d9d3039813c54ecc5310141f3019afd6c66e9f
Signed-off-by: saerome.kim <saerome.kim@samsung.com>
CMakeLists.txt diff | blob | history
packaging/nfc-manager.spec diff | blob | history
unittest/CMakeLists.txt [deleted file] blob | history
unittest/nfc_manager_hal_tc.cpp [deleted file] blob | history
unittest/unittest.h [deleted file] blob | history
Domain: Network & Connectivity / NFC;