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(parent: 01003b8) | patch
Compile IAMCU tests with -fno-pie -no-pie
authorH.J. Lu <hongjiu.lu@intel.com>
Tue, 4 Aug 2015 11:54:20 +0000 (11:54 +0000)
committerH.J. Lu <hjl@gcc.gnu.org>
Tue, 4 Aug 2015 11:54:20 +0000 (04:54 -0700)
commit75587afb1872f6451eacd6089b6c8b8719550a60
tree93c67cbe40fa60f55a16696999090315c6bab640tree | snapshot
parent01003b83810cbaff81d9a7c00947afa725cbbe9acommit | diff
Compile IAMCU tests with -fno-pie -no-pie

Since IAMCU tests clear all scratch integer registers with:

  asm __volatile__ ("xor %%eax, %%eax\n\t" \
                    "xor %%edx, %%edx\n\t" \
                    "xor %%ecx, %%ecx\n\t" \
                    ::: "eax", "edx", "ecx");

PIC register may be trashed between setting PIC register and using it.
This patch compiles AMCU tests with -fno-pie -no-pie.

PR target/67110
* gcc.target/i386/iamcu/abi-iamcu.exp (additional_flags): Add
-fno-pie -no-pie.

From-SVN: r226570
gcc/testsuite/ChangeLog diff | blob | history
gcc/testsuite/gcc.target/i386/iamcu/abi-iamcu.exp diff | blob | history
Domain: System / Toolchain;