[PORT FROM R2]Battery: improve fault handling for weak chargers
authorRamakrishna Pallala <ramakrishna.pallala@intel.com>
Tue, 17 Jan 2012 09:07:10 +0000 (14:37 +0530)
committerbuildbot <buildbot@intel.com>
Tue, 24 Jan 2012 15:21:12 +0000 (07:21 -0800)
commit75364c6ca47ad2f98c4e641d30df8cc648185dad
tree14eb8fbd9e3069568d696494858d7b7a6ee65dbc
parentb33376d7c8baa6355a101434e3101ecfa0c218d1
[PORT FROM R2]Battery: improve fault handling for weak chargers

BZ: 17841

This patch lowers the VBUSDET threshold and improves the fault handling
by checking the USBDET bit and the charging mode parameters.

R2-Change-Id: Iabd0b004fc7d85d56c60337b1896e09035c6f044
Signed-off-by: Ramakrishna Pallala <ramakrishna.pallala@intel.com>
Conflicts:

drivers/power/intel_mdf_battery.c

Change-Id: I63ed7a73df212e4ed6b6fa13d49a2fa6d0552a2b
Signed-off-by: Eduardo Mendi <eduardox.mendi@intel.com>
Reviewed-on: http://android.intel.com:8080/32756
Reviewed-by: buildbot <buildbot@intel.com>
Tested-by: buildbot <buildbot@intel.com>
drivers/power/intel_mdf_battery.c
drivers/power/intel_mdf_charger.h