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(parent: e51b7bf) | patch
[AArch64][ARM] Remove load from dup and vmul tests. NFC
authorDavid Green <david.green@arm.com>
Tue, 20 Dec 2022 15:23:38 +0000 (15:23 +0000)
committerDavid Green <david.green@arm.com>
Tue, 20 Dec 2022 15:23:38 +0000 (15:23 +0000)
commit752819e813d1de1e76b4b509ad6fbb97b52d2d03
tree73f711e4ce0b66f45e6d00dcbf79c361eec14193tree | snapshot
parente51b7bff192f5c2712009a28eed1544ff45913c1commit | diff
[AArch64][ARM] Remove load from dup and vmul tests. NFC

These tests needn't use loads in their testing of dup and mul
instructions, and as the load changes the test may no longer test what
they are intending (as in D140069).
llvm/test/CodeGen/AArch64/arm64-dup.ll diff | blob | history
llvm/test/CodeGen/AArch64/arm64-vmul.ll diff | blob | history
llvm/test/CodeGen/ARM/vdup.ll diff | blob | history
Domain: System / Toolchain;