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(parent: da821cc) | patch
auto-test: check feature using system-info library 79/270479/1
authorYoungjae Cho <y0.cho@samsung.com>
Thu, 3 Feb 2022 07:25:20 +0000 (16:25 +0900)
committerYoungjae Cho <y0.cho@samsung.com>
Thu, 3 Feb 2022 07:30:24 +0000 (16:30 +0900)
commit72af31622002613274e134f23b919fc82bc6e956
tree2ce099b310061a673adcbdfd1000f514e0214cectree | snapshot
parentda821cc39e8002408955587260de1af8b9082a88commit | diff
auto-test: check feature using system-info library

Previously, the uniitest is conducted based on statically defined
configuration file, auto-test.conf. Replace it to system-info API,
which fetches feature on runtime. Therefore it is able to find feature
on various target without defining one by one in advance whether a test
can be deserved.

Change-Id: Iaf445edc4c566517c37106dd00c67c42cd7f813a
Signed-off-by: Youngjae Cho <y0.cho@samsung.com>
14 files changed:
packaging/deviced.spec diff | blob | history
tests/auto-test/CMakeLists.txt diff | blob | history
tests/auto-test/auto-test.conf [deleted file] blob | history
tests/auto-test/battery-monitor-test.c diff | blob | history
tests/auto-test/battery.c diff | blob | history
tests/auto-test/config.c [deleted file] blob | history
tests/auto-test/config.h [deleted file] blob | history
tests/auto-test/display.c diff | blob | history
tests/auto-test/ir.c diff | blob | history
tests/auto-test/led.c diff | blob | history
tests/auto-test/main.c diff | blob | history
tests/auto-test/test.c diff | blob | history
tests/auto-test/test.h diff | blob | history
tests/auto-test/touchscreen.c diff | blob | history
Domain: System / System Framework;