tests: refactor of atspi test suite
authorLukasz Stanislawski <l.stanislaws@samsung.com>
Mon, 21 Jul 2014 15:16:54 +0000 (17:16 +0200)
committerLukasz Stanislawski <l.stanislaws@samsung.com>
Mon, 21 Jul 2014 15:33:56 +0000 (17:33 +0200)
commit7205de042a9b20adbb70a68e2088762e531c7625
tree7a2095ba1d01d36c0810e37ebf67f5fc2586464e
parent6ba1627f8e30212257d6736bfc1db4b2306b44a1
tests: refactor of atspi test suite

Summary:
elm_test_atspi adjusted to recent internal api changes. Tests regarding elm_win
moved from elm_test_atspi to elm_test_win. Entry tests fixed. Test to
Atspi_Selection interface temporary skipped.

Reviewers: z.kosinski

Reviewed By: z.kosinski

Differential Revision: https://phab.enlightenment.org/D1199
legacy/elementary/src/tests/elm_test_atspi.c
legacy/elementary/src/tests/elm_test_entry.c
legacy/elementary/src/tests/elm_test_glview.c
legacy/elementary/src/tests/elm_test_list.c
legacy/elementary/src/tests/elm_test_win.c