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(parent: fa7b65c) | patch
config (dynamic): unit tests, test config extracted 10/31710/13
authorKrzysztof Dynowski <k.dynowski@samsung.com>
Sat, 6 Dec 2014 12:05:46 +0000 (13:05 +0100)
committerKrzysztof Dynowski <k.dynowski@samsung.com>
Mon, 22 Dec 2014 11:50:48 +0000 (12:50 +0100)
commit719daa453260d4cbcad85d0e6dbfd2434b779625
tree75cc71205b837e80b3b1476fa003e66f5e5640fatree | snapshot
parentfa7b65cc7179ef7a037f5d3114fe501147e0e72bcommit | diff
config (dynamic): unit tests, test config extracted

[Bug/Feature]   test loading config defaults from json
[Cause]         N/A
[Solution]      N/A
[Verification]  Build, install, run tests

Change-Id: Ia9ad29af5e343642d9ca7ae26b126c3efe45beab
tests/unit_tests/config/testconfig-example.hpp [new file with mode: 0644] blob
tests/unit_tests/config/ut-configuration.cpp diff | blob | history
tests/unit_tests/config/ut-dynvisit.cpp [new file with mode: 0644] blob
Domain: Security / Container;