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[Coverage/Inf] Increase test coverage for input services
authorDongju Chae <dongju.chae@samsung.com>
Tue, 21 Apr 2020 08:42:57 +0000 (17:42 +0900)
committer송욱/On-Device Lab(SR)/Staff Engineer/삼성전자 <wook16.song@samsung.com>
Thu, 23 Apr 2020 07:28:42 +0000 (16:28 +0900)
commit6e2a61fbf86c31cafe9456539216a20ebb37fd4c
treebb7469155d6bffccbf3fef35fdd0c4b1b315feb6tree | snapshot
parentd7ff30adafc5be55784a3b4c5c732aceaa49f5aecommit | diff
[Coverage/Inf] Increase test coverage for input services

This patch increases test coverage for input services.

Signed-off-by: Dongju Chae <dongju.chae@samsung.com>
src/core/ne-hw-input-service.cc diff | blob | history
src/core/ne-inputservice.h diff | blob | history
tests/unittests/ne_core_inputservice_test.cc diff | blob | history
Domain: Machine Learning / ML Framework;