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(parent: f878043) | patch
tests/ecore: add stress test for main loop signal handling
authorMike Blumenkrantz <zmike@samsung.com>
Thu, 19 Sep 2019 18:15:45 +0000 (14:15 -0400)
committerJongmin Lee <jm105.lee@samsung.com>
Fri, 20 Sep 2019 21:08:45 +0000 (06:08 +0900)
commit6425908cd35c6f5d34c8376cb7cd4aaa463716bc
tree7c23d5ce50576ae1949c766f88cb878ebd14d522tree | snapshot
parentf8780432b66f03fb35b4d9c84c2f2a983c8526e7commit | diff
tests/ecore: add stress test for main loop signal handling

this explodes after about 500 signals, so make it 1000 for a good test

Reviewed-by: Cedric BAIL <cedric.bail@free.fr>
Differential Revision: https://phab.enlightenment.org/D10026
src/tests/ecore/ecore_test_job.c diff | blob | history
Domain: UI Framework / EFL;