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(parent: 10b60dd) | patch
[X86] Remove single incoming value phis from tests for the loop SAD pattern. NFC
authorCraig Topper <craig.topper@intel.com>
Fri, 17 Apr 2020 20:37:47 +0000 (13:37 -0700)
committerCraig Topper <craig.topper@intel.com>
Fri, 17 Apr 2020 20:39:47 +0000 (13:39 -0700)
commit5f69e53e5592141bf81f41fdf92106bf5cc3821c
tree5d6dcfb62d316241ddbb5e4e55099b7489f87642tree | snapshot
parent10b60dde767011c250649dc6a305379034c5b5c5commit | diff
[X86] Remove single incoming value phis from tests for the loop SAD pattern. NFC

InstCombine should ensure these don't exist.

I'm looking at making some changes to how we detect these
patterns and not having to worry about these phis will help.
llvm/test/CodeGen/X86/min-legal-vector-width.ll diff | blob | history
llvm/test/CodeGen/X86/sad.ll diff | blob | history
Domain: System / Toolchain;