[SystemZ] Reformat assembler/disassembler tests
authorUlrich Weigand <ulrich.weigand@de.ibm.com>
Wed, 10 May 2017 12:39:11 +0000 (12:39 +0000)
committerUlrich Weigand <ulrich.weigand@de.ibm.com>
Wed, 10 May 2017 12:39:11 +0000 (12:39 +0000)
commit52461726dd7de97f5f83f50baaf542a2e86f25ce
tree55d8bfa45bc64c68b2f5da507ae8888cf254ddfc
parentc29af824bff54622ee15364d30048c1a7c8d4715
[SystemZ] Reformat assembler/disassembler tests

The assembler and disassmebler test cases started out formatted and
sorted in a particular way, but this got lost over time as patches
were added.  Reformat them again.  NFC.

llvm-svn: 302642
llvm/test/MC/Disassembler/SystemZ/insns-z13.txt
llvm/test/MC/Disassembler/SystemZ/insns.txt
llvm/test/MC/SystemZ/insn-bad-z13.s
llvm/test/MC/SystemZ/insn-bad-z196.s
llvm/test/MC/SystemZ/insn-bad-zEC12.s
llvm/test/MC/SystemZ/insn-bad.s
llvm/test/MC/SystemZ/insn-good-z13.s
llvm/test/MC/SystemZ/insn-good-z196.s
llvm/test/MC/SystemZ/insn-good-zEC12.s
llvm/test/MC/SystemZ/insn-good.s