projects / platform / upstream / libinput.git / commit
? search:
summary | shortlog | log | commit | commitdiff | tree
(parent: 6595036) | patch
test: Use only one test device for some udev and path tests
authorJonas Ådahl <jadahl@gmail.com>
Sun, 13 Jul 2014 22:01:10 +0000 (00:01 +0200)
committerJonas Ådahl <jadahl@gmail.com>
Mon, 18 Aug 2014 20:35:19 +0000 (22:35 +0200)
commit4be59a972a89ea013b21ccdca19afe8456267520
treea43d554d45d9f0e391dd38ef518f38a8c29e243atree | snapshot
parent6595036d620148a806675a834e601f0121ece400commit | diff
test: Use only one test device for some udev and path tests

Some tests in test/path.c and test/udev.c are not dependent on
device behaviour but rather managing of device lifetime etc. Run those
tests only once with only one device, resulting more or less the same
code coverage but shorter run time.

Signed-off-by: Jonas Ådahl <jadahl@gmail.com>
Reviewed-by: Peter Hutterer <peter.hutterer@who-t.net>
test/litest.c diff | blob | history
test/litest.h diff | blob | history
test/path.c diff | blob | history
test/udev.c diff | blob | history
Domain: Graphics System / Input Management;