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(parent: 46185cd) | patch
kselftest: arm64: fake_sigreturn_bad_size
authorCristian Marussi <cristian.marussi@arm.com>
Fri, 25 Oct 2019 17:57:16 +0000 (18:57 +0100)
committerCatalin Marinas <catalin.marinas@arm.com>
Fri, 8 Nov 2019 11:10:50 +0000 (11:10 +0000)
commit49978aa8f079633192928cb966dcde39a3ff0747
treef52e73233bf29db5327bdc4f63918c4fe759d07etree | snapshot
parent46185cd1241b46c94933752137cde18ecfaf3766commit | diff
kselftest: arm64: fake_sigreturn_bad_size

Add a simple fake_sigreturn testcase which builds a ucontext_t with a
badly sized header that causes a overrun in the __reserved area and
place it onto the stack. Expects a SIGSEGV on test PASS.

Reviewed-by: Dave Martin <Dave.Martin@arm.com>
Signed-off-by: Cristian Marussi <cristian.marussi@arm.com>
Signed-off-by: Catalin Marinas <catalin.marinas@arm.com>
tools/testing/selftests/arm64/signal/testcases/fake_sigreturn_bad_size.c [new file with mode: 0644] blob
Domain: System / Kernel;