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(parent: 4f70ec2) | patch
Add GPIO unit test 71/130871/7
authorHyeongsik Min <hyeongsik.min@samsung.com>
Wed, 24 May 2017 07:31:03 +0000 (16:31 +0900)
committerHyeongsik Min <hyeongsik.min@samsung.com>
Thu, 25 May 2017 08:05:59 +0000 (17:05 +0900)
commit46b2e09e69cce2257a90efdf5b67a5c3ce3c6f41
tree9baed4def9bd2214206c337cfa528bafbd6e6b4ftree | snapshot
parent4f70ec201719542d860af4cd100774a05c6ad7c2commit | diff
Add GPIO unit test

This patch also implements menu for each tc module and utilizes glib
IO channel to receive user input.

Change-Id: Iedce7feab1887c822b172c30aba58b0f0eab959c
Signed-off-by: Hyeongsik Min <hyeongsik.min@samsung.com>
test/peripheral-io-test.c diff | blob | history
Domain: System / System Framework Device Management;