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(parent: e4178ad) | patch
eet: reduce the time taken by eet tests suite and hopefully reduce the risk for failure.
authorCedric BAIL <cedric.bail@free.fr>
Mon, 23 Jan 2012 16:53:51 +0000 (16:53 +0000)
committerCedric BAIL <cedric.bail@free.fr>
Mon, 23 Jan 2012 16:53:51 +0000 (16:53 +0000)
commit41dd3798728a71e263c032dbc5c35cd37e524c93
treeb8e2b708be1996536dba6b64e51ad118df40354btree | snapshot
parente4178ad8e631ca53e3613cb0f3b9774147f162b3commit | diff
eet: reduce the time taken by eet tests suite and hopefully reduce the risk for failure.

SVN revision: 67480
legacy/eet/src/tests/eet_suite.c diff | blob | history
Domain: UI Framework / EFL;