app: Remove test code 06/156206/1
authorpr.jung <pr.jung@samsung.com>
Tue, 17 Oct 2017 11:43:30 +0000 (20:43 +0900)
committerHyotaek Shim <hyotaek.shim@samsung.com>
Tue, 17 Oct 2017 11:48:12 +0000 (11:48 +0000)
commit3fdd98163e528ddaeaddec8aea08874bee700e11
tree4134781cd1ae13e961245e2efdeb865e8d50f48c
parente56b76a6d8ffbcbadc8fc60c698fee413d548e4c
app: Remove test code

- Get Primary mmc id and devpath using dbus method call

Change-Id: I0a798bad0dfb7e7ad69e986c81f37c2620c1067d
Signed-off-by: pr.jung <pr.jung@samsung.com>
(cherry picked from commit c670c0e89036d4f96847456b0c8f896c38503fb3)
apps/extended-sd/include/extended-sd-main.h
apps/extended-sd/src/es-internal-storage-page.c
apps/extended-sd/src/extended-sd-main.c