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(parent: dd3e542) | patch
[flang][NFC] Add IO related lowering tests
authorValentin Clement <clementval@gmail.com>
Wed, 23 Mar 2022 15:53:11 +0000 (16:53 +0100)
committerValentin Clement <clementval@gmail.com>
Wed, 23 Mar 2022 15:54:03 +0000 (16:54 +0100)
commit3ea6727e33d24c54ea6afb8887846a1f9a1011c3
tree259fb0dafa536035f12eb5a4f93e92e8165fb9bftree | snapshot
parentdd3e54213cb6f4227654488951b3f9d6b9269e36commit | diff
[flang][NFC] Add IO related lowering tests

This patch adds lowering tests for IO related use cases.

This patch is part of the upstreaming effort from fir-dev branch.

Reviewed By: PeteSteinfeld

Differential Revision: https://reviews.llvm.org/D122321

Co-authored-by: Jean Perier <jperier@nvidia.com>
Co-authored-by: Eric Schweitz <eschweitz@nvidia.com>
flang/test/Lower/io-item-list.f90 [new file with mode: 0644] blob
flang/test/Lower/io-statement-clean-ups.f90 [new file with mode: 0644] blob
Domain: System / Toolchain;