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(parent: d263e31) | patch
eina_test_fp: Improve speed of eina_fp test
authorDaniel Willmann <d.willmann@samsung.com>
Thu, 27 Jun 2013 13:27:36 +0000 (14:27 +0100)
committerDaniel Willmann <d.willmann@samsung.com>
Thu, 27 Jun 2013 13:34:02 +0000 (14:34 +0100)
commit3e5ff22ab95fb72715b3c844b437e8a15067c36d
tree1317a907a6b477d283e4423d04edcb4efd95f954tree | snapshot
parentd263e31c7f047755be59d5c92dfbe09f6331be5ecommit | diff
eina_test_fp: Improve speed of eina_fp test

Test less values in between, but still have a decent combination of
large/small values to test.

Fixes -WTasn

Signed-off-by: Daniel Willmann <d.willmann@samsung.com>
src/tests/eina/eina_test_fp.c diff | blob | history
Domain: UI Framework / EFL;