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(parent: 51e6da8) | patch
Remove few EGL robustness tests
authorBrandon Schade <b.schade@samsung.com>
Tue, 28 Sep 2021 19:28:20 +0000 (12:28 -0700)
committerMatthew Netsch <quic_mnetsch@quicinc.com>
Sat, 13 Nov 2021 16:04:40 +0000 (16:04 +0000)
commit39c99a7ece4b6618cde30c6c621bd3036801bd4b
treed3b3ccad4f41e571ff97c415d8dbe3144cb19d5dtree | snapshot
parent51e6da82e9ff190b7598f9d494f8fa860e1ce2bdcommit | diff
Remove few EGL robustness tests

Components: EGL

Affects:
dEQP-EGL.functional.robustness.reset_context.shaders.infinite_loop.*

VK-GL-CTS issue: 257

Change-Id: I9edb2e577fb14b98d83bb16dc31188d3a901606d
android/cts/master/egl-master.txt diff | blob | history
external/openglcts/data/mustpass/egl/aosp_mustpass/3.2.3.x/src/egl-master.txt diff | blob | history
external/openglcts/data/mustpass/egl/aosp_mustpass/3.2.3.x/src/egl-test-issues.txt diff | blob | history
external/openglcts/data/mustpass/egl/aosp_mustpass/3.2.4.x/src/egl-master.txt diff | blob | history
external/openglcts/data/mustpass/egl/aosp_mustpass/3.2.4.x/src/egl-test-issues.txt diff | blob | history
external/openglcts/data/mustpass/egl/aosp_mustpass/3.2.5.x/src/egl-test-issues.txt diff | blob | history
external/openglcts/data/mustpass/egl/aosp_mustpass/3.2.6.x/egl-master.txt diff | blob | history
external/openglcts/data/mustpass/egl/aosp_mustpass/master/egl-master.txt diff | blob | history
modules/egl/teglRobustnessTests.cpp diff | blob | history
Domain: Graphics System / GL;