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(parent: f176f3c) | patch
limiter divided into positive and negative tests 73/228973/2
authorAgnieszka Baumann <a.baumann@samsung.com>
Wed, 25 Mar 2020 09:21:52 +0000 (10:21 +0100)
committerAgnieszka Baumann <a.baumann@samsung.com>
Mon, 30 Mar 2020 10:53:16 +0000 (12:53 +0200)
commit357865e8f115b9a27dde19d345cc7fc1b55294ca
treeefb1c08cf23545f5484e24b41c1926158d0cb40btree | snapshot
parentf176f3c80e56517bedc17611fbb55e925d5e2cb4commit | diff
limiter divided into positive and negative tests

Change-Id: I25b01d7c093d80cf01bd6585a8ef526ceda915ef
Makefile.am diff | blob | history
src/tests/limiter_neg.c [new file with mode: 0644] blob
src/tests/limiter_pos.c [moved from src/tests/limiter.c with 68% similarity] diff | blob | history
src/tests/limiter_wrap.c [new file with mode: 0644] blob
Domain: System / System Framework;