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(parent: 36200df) | patch
Optimize swapchain OOM tests
authorPyry Haulos <phaulos@google.com>
Wed, 4 Jan 2017 22:30:07 +0000 (14:30 -0800)
committerPyry Haulos <phaulos@google.com>
Fri, 6 Jan 2017 20:35:43 +0000 (15:35 -0500)
commit2beac9057d9113ac306632d819ded852691a6842
tree9884b33f298798b82f7b3431b0970de489fe0d95tree | snapshot
parent36200dfceaeb7d7a6b92ce24b7a12f7ddaf31a63commit | diff
Optimize swapchain OOM tests

Swapchain OOM tests were hitting timeouts on some platforms. This commit
optimizes the tests in two ways:

 * VkInstance, VkDevice, and VkSurface are now re-used across all
sub-cases.

 * Loop is re-written to avoid re-creating swapchains for parameters
0..N-1 when testing parameter combination N.

Affects: dEQP-VK.wsi.*.swapchain.simulate_oom.*

Bug: 33555898
Change-Id: Ib5e1a4944e4c400a5d430c5a3d20fe0930c6eed0
external/vulkancts/framework/vulkan/vkAllocationCallbackUtil.cpp diff | blob | history
external/vulkancts/framework/vulkan/vkAllocationCallbackUtil.hpp diff | blob | history
external/vulkancts/modules/vulkan/api/vktApiObjectManagementTests.cpp diff | blob | history
external/vulkancts/modules/vulkan/wsi/vktWsiSurfaceTests.cpp diff | blob | history
external/vulkancts/modules/vulkan/wsi/vktWsiSwapchainTests.cpp diff | blob | history
Domain: Graphics System / GL;