tests: fix mem leak in eina_test_hash_add_del_by_hash
authorMike Blumenkrantz <zmike@osg.samsung.com>
Fri, 30 Mar 2018 17:52:46 +0000 (13:52 -0400)
committerWonki Kim <wonki_.kim@samsung.com>
Tue, 10 Apr 2018 13:25:51 +0000 (22:25 +0900)
commit2bb9bf083ddc5ed3e9e7445f1d9d26fd0b3b1e45
tree5b29f01aaae9d1c3eab14d81a1ccf61506e64a95
parentdc6e4dba3d0273ce594545bc68f8284e439f6396
tests: fix mem leak in eina_test_hash_add_del_by_hash

Reviewed-by: Stefan Schmidt <stefan@osg.samsung.com>
src/tests/eina/eina_test_hash.c