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(parent: 1f11ae0) | patch
plugin-api: deviced: Add interface for detecting setting value change 70/312870/1
authorYoungjae Cho <y0.cho@samsung.com>
Wed, 5 Jun 2024 07:08:15 +0000 (16:08 +0900)
committerYoungjae Cho <y0.cho@samsung.com>
Mon, 17 Jun 2024 04:54:57 +0000 (13:54 +0900)
commit1804a1fff4b31c832b07c90d5547d54b7447fd68
treea8db834fc6bab8c632aeefee726d3777d78d88cbtree | snapshot
parent1f11ae0030c65ea0423fc430896c0c0a62283939commit | diff
plugin-api: deviced: Add interface for detecting setting value change

The function has been added as display plugin operation
 : on_changed_setting_value(int key, int value)

It is invoked when setting app changes display setting such as
screen timeout or brightness. The parameters are saying that which
'key' has changed to what 'value'.

Change-Id: Id904488c3fb393a648618d4fd30df2d283dfa6ef
Signed-off-by: Youngjae Cho <y0.cho@samsung.com>
src/plugin-api/deviced/include/system/syscommon-plugin-deviced-display-interface.h diff | blob | history
src/plugin-api/deviced/include/system/syscommon-plugin-deviced-display.h diff | blob | history
src/plugin-api/deviced/src/syscommon-plugin-deviced-display.c diff | blob | history
tests/CMakeLists.txt diff | blob | history
tests/plugin-api/deviced/test-plugin-display.c [new file with mode: 0644] blob
tests/plugin-api/deviced/test.c [new file with mode: 0644] blob
tests/test-mock.c diff | blob | history
tests/test-mock.h diff | blob | history
Domain: System / System Framework Device Management;