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(parent: c65be23) | patch
Add gtest to test neg op for int datatype (#3930)
authorShubham Gupta/SNAP /SRI-Bangalore/Engineer/삼성전자 <shub98.gupta@samsung.com>
Wed, 12 Dec 2018 01:13:43 +0000 (06:43 +0530)
committer오형석/동작제어Lab(SR)/Staff Engineer/삼성전자 <hseok82.oh@samsung.com>
Wed, 12 Dec 2018 01:13:43 +0000 (10:13 +0900)
commit179cff69263242cb6e2e4e80973cbedab51299ae
treeea11714ec4b6831815c804b42558e7abe80a5featree | snapshot
parentc65be23760d2ddd09df819504bff132e11beb9c7commit | diff
Add gtest to test neg op for int datatype (#3930)

This patch will add gtest to test neg for int datatype

Signed-off-by: shubham <shub98.gupta@samsung.com>
runtimes/tests/neural_networks_test/specs/Ex/neg_ex_3D_int.mod.py [new file with mode: 0644] blob
runtimes/tests/neural_networks_test/specs/Ex/neg_ex_4D_int.mod.py [new file with mode: 0644] blob
Domain: Machine Learning / ML Framework;