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(parent: 52298c7) | patch
tests: extract header to a separate file 23/286423/3
authorMichal Bloch <m.bloch@samsung.com>
Thu, 5 Jan 2023 18:50:03 +0000 (19:50 +0100)
committerMichal Bloch <m.bloch@samsung.com>
Thu, 12 Jan 2023 12:51:20 +0000 (13:51 +0100)
commit12084059b6fa4dd74241beb4be453b98ee33fbdd
tree44ca5684eed1cc512e4a44d647995aed53679371tree | snapshot
parent52298c7e1659ffefb72f3b67313379a645989baccommit | diff
tests: extract header to a separate file

Can be included by specific, focused tests in the future,
allowing to reduce the time it takes to test individual
features (since a lot of time is wasted waiting for other
irrelevant tests to run).

Change-Id: Id5046219726a7cdeb2177ea10ac36d46fa717923
Makefile.am diff | blob | history
configure.ac diff | blob | history
packaging/dlog.spec diff | blob | history
tests/dlog_test.in diff | blob | history
tests/dlog_test_header.in [new file with mode: 0644] blob
Domain: System / System Framework;