Build break in tests after "clean-up unused feature data".
authorZbigniew Kostrzewa <z.kostrzewa@samsung.com>
Mon, 8 Apr 2013 12:16:02 +0000 (14:16 +0200)
committerZbigniew Kostrzewa <z.kostrzewa@samsung.com>
Mon, 8 Apr 2013 12:21:10 +0000 (14:21 +0200)
commit1022919fe54ee1678f72dda9a1b8a29aa5296558
tree27105a86b0b51d693928917c5bb8e325a79e9e77
parente7ad60c09541176401a83da8220d517dfffa407e
Build break in tests after "clean-up unused feature data".

[Issue#] N/A
[Problem] Build break in tests.
[Cause] Changes in feature data.
[Solution] Fix tests.
[SCMRequest] N/A

[Verification]
1. Build respository (with tests!).
2. Run all wrt-commons-tests-*.
3. All tests should pass.

Change-Id: I65c4c0a8f21999431b3fe8cc60fe2b690a712f4f
tests/dao/TestCases_WidgetDAO.cpp