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(parent: fbae70f) | patch
eio: add test to ensure proper lifecycle of Efl_Io object and futures.
authorYeongjong Lee <yj34.lee@samsung.com>
Fri, 15 Mar 2019 21:51:54 +0000 (14:51 -0700)
committerJunsuChoi <jsuya.choi@samsung.com>
Tue, 2 Apr 2019 04:14:38 +0000 (13:14 +0900)
commit0f2991ee5fcd0cacbc40c6c9c87683b93aa8d390
tree3e5f376c165264ab0883c5710d9d22b802d4b7catree | snapshot
parentfbae70f465fcaa9eb6a67cdd10cbf71d3687b5b3commit | diff
eio: add test to ensure proper lifecycle of Efl_Io object and futures.

Reviewed-by: Marcel Hollerbach <mail@marcel-hollerbach.de>
Differential Revision: https://phab.enlightenment.org/D8372
src/tests/eio/efl_io_model_test_file.c diff | blob | history
Domain: UI Framework / EFL;