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(parent: 03e0d2a) | patch
tests: wrap critical errors to disable aborting in eo tests
authorMike Blumenkrantz <zmike@samsung.com>
Tue, 12 Jun 2018 23:20:21 +0000 (19:20 -0400)
committerJongmin Lee <jm105.lee@samsung.com>
Mon, 18 Jun 2018 21:49:54 +0000 (06:49 +0900)
commit0f03a2732f955dbce9e5a1a1c45d9c78f0be22b9
treedc601421268fe37aed09c5f323577e4c9d8c8cf6tree | snapshot
parent03e0d2a7755ae1887ea5aededb28258d26a61e8ccommit | diff
tests: wrap critical errors to disable aborting in eo tests

ref T7002

Differential Revision: https://phab.enlightenment.org/D6271
src/tests/eo/suite/eo_test_class_behaviour_errors.c diff | blob | history
src/tests/eo/suite/eo_test_general.c diff | blob | history
src/tests/eo/suite/eo_test_lifecycle.c diff | blob | history
Domain: UI Framework / EFL;