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(parent: b0ef0d2) | patch
tests: greatly reduce iterations for eina_rbtree_remove test
authorMike Blumenkrantz <zmike@osg.samsung.com>
Thu, 29 Mar 2018 19:54:02 +0000 (15:54 -0400)
committerWonki Kim <wonki_.kim@samsung.com>
Tue, 10 Apr 2018 13:25:48 +0000 (22:25 +0900)
commit0aaca412ec3f1b212f7563acea7c0c49e1d829d6
treefa332e1689961b679832d2116efc829329f176a1tree | snapshot
parentb0ef0d213d67524d97ebfe475c2d727c5c696780commit | diff
tests: greatly reduce iterations for eina_rbtree_remove test

this has no bearing on coverage, so there is not much point in uselessly
iterating here

ref T6830

Reviewed-by: Stefan Schmidt <stefan@osg.samsung.com>
src/tests/eina/eina_test_rbtree.c diff | blob | history
Domain: UI Framework / EFL;