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(parent: 2dca6f8) | patch
iso-tester: Introduce tests for Disconnect/Reconnect
authorLuiz Augusto von Dentz <luiz.von.dentz@intel.com>
Mon, 15 Aug 2022 19:01:56 +0000 (12:01 -0700)
committerAyush Garg <ayush.garg@samsung.com>
Mon, 15 May 2023 09:25:54 +0000 (14:55 +0530)
commit0046ce1c676cd2fdcc89396020e398869184bcce
tree3f9962d5c2348b92eeb40edef2e1c9c3bc10ed4btree | snapshot
parent2dca6f8344b216be6b907aa522bde6594806100ccommit | diff
iso-tester: Introduce tests for Disconnect/Reconnect

This introduces a test that do use shutdown to disconnect an ISO socket
and then another one that attempts to reconnect it again to emulate
upper profile transitions.

Signed-off-by: Manika Shrivastava <manika.sh@samsung.com>
Signed-off-by: Ayush Garg <ayush.garg@samsung.com>
tools/iso-tester.c diff | blob | history
Domain: Network & Connectivity / Bluetooth;