+// SPDX-License-Identifier: GPL-2.0+
/*
* Copyright (C) 2013 Google, Inc
*
- * SPDX-License-Identifier: GPL-2.0+
- *
* Note: Test coverage does not include 10-bit addressing
*/
#include <dm.h>
#include <fdtdec.h>
#include <i2c.h>
+#include <asm/state.h>
+#include <asm/test.h>
#include <dm/device-internal.h>
#include <dm/test.h>
#include <dm/uclass-internal.h>
-#include <dm/ut.h>
#include <dm/util.h>
-#include <asm/state.h>
-#include <asm/test.h>
+#include <test/ut.h>
static const int busnum;
static const int chip = 0x2c;
/* Test that we can find buses and chips */
-static int dm_test_i2c_find(struct dm_test_state *dms)
+static int dm_test_i2c_find(struct unit_test_state *uts)
{
struct udevice *bus, *dev;
const int no_chip = 0x10;
false, &bus));
/*
- * i2c_post_bind() will bind devices to chip selects. Check this then
- * remove the emulation and the slave device.
+ * The post_bind() method will bind devices to chip selects. Check
+ * this then remove the emulation and the slave device.
*/
ut_assertok(uclass_get_device_by_seq(UCLASS_I2C, busnum, &bus));
ut_assertok(dm_i2c_probe(bus, chip, 0, &dev));
- ut_asserteq(-ENODEV, dm_i2c_probe(bus, no_chip, 0, &dev));
+ ut_asserteq(-ENOENT, dm_i2c_probe(bus, no_chip, 0, &dev));
ut_asserteq(-ENODEV, uclass_get_device_by_seq(UCLASS_I2C, 1, &bus));
return 0;
}
DM_TEST(dm_test_i2c_find, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_read_write(struct dm_test_state *dms)
+static int dm_test_i2c_read_write(struct unit_test_state *uts)
{
struct udevice *bus, *dev;
uint8_t buf[5];
}
DM_TEST(dm_test_i2c_read_write, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_speed(struct dm_test_state *dms)
+static int dm_test_i2c_speed(struct unit_test_state *uts)
{
struct udevice *bus, *dev;
uint8_t buf[5];
ut_assertok(uclass_get_device_by_seq(UCLASS_I2C, busnum, &bus));
+
+ /* Use test mode so we create the required errors for invalid speeds */
+ sandbox_i2c_set_test_mode(bus, true);
ut_assertok(i2c_get_chip(bus, chip, 1, &dev));
ut_assertok(dm_i2c_set_bus_speed(bus, 100000));
ut_assertok(dm_i2c_read(dev, 0, buf, 5));
ut_asserteq(400000, dm_i2c_get_bus_speed(bus));
ut_assertok(dm_i2c_read(dev, 0, buf, 5));
ut_asserteq(-EINVAL, dm_i2c_write(dev, 0, buf, 5));
+ sandbox_i2c_set_test_mode(bus, false);
return 0;
}
DM_TEST(dm_test_i2c_speed, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_offset_len(struct dm_test_state *dms)
+static int dm_test_i2c_offset_len(struct unit_test_state *uts)
{
struct udevice *bus, *dev;
uint8_t buf[5];
}
DM_TEST(dm_test_i2c_offset_len, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_probe_empty(struct dm_test_state *dms)
+static int dm_test_i2c_probe_empty(struct unit_test_state *uts)
{
struct udevice *bus, *dev;
ut_assertok(uclass_get_device_by_seq(UCLASS_I2C, busnum, &bus));
+
+ /* Use test mode so that this chip address will always probe */
+ sandbox_i2c_set_test_mode(bus, true);
ut_assertok(dm_i2c_probe(bus, SANDBOX_I2C_TEST_ADDR, 0, &dev));
+ sandbox_i2c_set_test_mode(bus, false);
return 0;
}
DM_TEST(dm_test_i2c_probe_empty, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_bytewise(struct dm_test_state *dms)
+static int dm_test_i2c_bytewise(struct unit_test_state *uts)
{
struct udevice *bus, *dev;
struct udevice *eeprom;
}
DM_TEST(dm_test_i2c_bytewise, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
-static int dm_test_i2c_offset(struct dm_test_state *dms)
+static int dm_test_i2c_offset(struct unit_test_state *uts)
{
struct udevice *eeprom;
struct udevice *dev;