* @testdev: Test device
* @force_fail_alloc: Force all memory allocs to fail
* @skip_post_probe: Skip uclass post-probe processing
+ * @fdt_chksum: crc8 of the device tree contents
+ * @fdt_copy: Copy of the device tree
+ * @fdt_size: Size of the device-tree copy
* @runs_per_test: Number of times to run each test (typically 1)
* @expect_str: Temporary string used to hold expected string value
* @actual_str: Temporary string used to hold actual string value
struct udevice *testdev;
int force_fail_alloc;
int skip_post_probe;
+ uint fdt_chksum;
+ void *fdt_copy;
+ uint fdt_size;
int runs_per_test;
char expect_str[512];
char actual_str[512];