Add tests for 16-bit OpSwitch

[platform/upstream/VK-GL-CTS.git] / android / cts / master / vk-master.txt

diff --git a/android/cts/master/vk-master.txt b/android/cts/master/vk-master.txt
index 0118846..22ac44d 100755 (executable)
--- a/android/cts/master/vk-master.txt
+++ b/android/cts/master/vk-master.txt
@@ -208275,6 +208275,11 @@ dEQP-VK.spirv_assembly.instruction.compute.opatomic_storage_buffer.idec
 dEQP-VK.spirv_assembly.instruction.compute.opatomic_storage_buffer.load
 dEQP-VK.spirv_assembly.instruction.compute.opatomic_storage_buffer.store
 dEQP-VK.spirv_assembly.instruction.compute.opatomic_storage_buffer.compex
+dEQP-VK.spirv_assembly.instruction.compute.opatomic_return_values.iadd
+dEQP-VK.spirv_assembly.instruction.compute.opatomic_return_values.isub
+dEQP-VK.spirv_assembly.instruction.compute.opatomic_return_values.iinc
+dEQP-VK.spirv_assembly.instruction.compute.opatomic_return_values.idec
+dEQP-VK.spirv_assembly.instruction.compute.opatomic_return_values.compex
 dEQP-VK.spirv_assembly.instruction.compute.opline.all
 dEQP-VK.spirv_assembly.instruction.compute.opmoduleprocessed.all
 dEQP-VK.spirv_assembly.instruction.compute.opnoline.all
@@ -212816,6 +212821,11 @@ dEQP-VK.spirv_assembly.type.scalar.i16.mul_sdiv_test_high_part_zero_tessc
 dEQP-VK.spirv_assembly.type.scalar.i16.mul_sdiv_test_high_part_zero_tesse
 dEQP-VK.spirv_assembly.type.scalar.i16.mul_sdiv_test_high_part_zero_geom
 dEQP-VK.spirv_assembly.type.scalar.i16.mul_sdiv_test_high_part_zero_frag
+dEQP-VK.spirv_assembly.type.scalar.i16.switch_vert
+dEQP-VK.spirv_assembly.type.scalar.i16.switch_tessc
+dEQP-VK.spirv_assembly.type.scalar.i16.switch_tesse
+dEQP-VK.spirv_assembly.type.scalar.i16.switch_geom
+dEQP-VK.spirv_assembly.type.scalar.i16.switch_frag
 dEQP-VK.spirv_assembly.type.scalar.i32.negate_vert
 dEQP-VK.spirv_assembly.type.scalar.i32.negate_tessc
 dEQP-VK.spirv_assembly.type.scalar.i32.negate_tesse
@@ -213016,6 +213026,11 @@ dEQP-VK.spirv_assembly.type.scalar.u16.mul_udiv_test_high_part_zero_tessc
 dEQP-VK.spirv_assembly.type.scalar.u16.mul_udiv_test_high_part_zero_tesse
 dEQP-VK.spirv_assembly.type.scalar.u16.mul_udiv_test_high_part_zero_geom
 dEQP-VK.spirv_assembly.type.scalar.u16.mul_udiv_test_high_part_zero_frag
+dEQP-VK.spirv_assembly.type.scalar.u16.switch_vert
+dEQP-VK.spirv_assembly.type.scalar.u16.switch_tessc
+dEQP-VK.spirv_assembly.type.scalar.u16.switch_tesse
+dEQP-VK.spirv_assembly.type.scalar.u16.switch_geom
+dEQP-VK.spirv_assembly.type.scalar.u16.switch_frag
 dEQP-VK.spirv_assembly.type.scalar.u32.div_vert
 dEQP-VK.spirv_assembly.type.scalar.u32.div_tessc
 dEQP-VK.spirv_assembly.type.scalar.u32.div_tesse